Alwyn Eades: search on Z-Library

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1

The image processing handbook, by John C. Russ CRC Press, Boca Raton, Florida, 1992, 445 pp, $89.95

Journal:

Microscopy Research and Technique

Year:

1994

File:

PDF, 82 KB

1994

2

Monte Carlo modeling for electron microscopy and microanalysis, by D. C. Joy. Oxford University Press, New York, 1995, 216 pp, $59.95

Journal:

Microscopy Research and Technique

Year:

1996

Language:

english

File:

PDF, 114 KB

english, 1996

3

Crystalline symmetries: An informal mathematical introduction, by M. Senechal. Adam Hilge, Bristol, UK, 1990, 137 pp, $39.90

Journal:

Microscopy Research and Technique

Year:

1994

File:

PDF, 56 KB

1994

4

Dream on

Journal:

Year:

2007

Language:

english

File:

PDF, 112 KB

english, 2007

5

Microscopía Electrónica: Una visió del microscosmos, by M. J. Yacamán and J. Reyes, Consejo Nacional de Ciencia y Technología, Mixico, 1995, 143 pp (price unavailable)

Journal:

Microscopy Research and Technique

Year:

1996

Language:

english

File:

PDF, 59 KB

english, 1996

6

Electron microscopy and analysis 1995, by D. Cherns, ed. Institute of Physics Conference Series 147, Institute of Physics, Bristol, 1995, 591 pp, UK £125/US$250. Microscopy of semiconducting materials 1995, by A. G. Cullis and A. E. Stanton-Bevan, eds. Institute of Physics Confernece Series 146, Institute of Physics, Bristol, 1995 795 pp, UK 160/US$320

Journal:

Microscopy Research and Technique

Year:

1996

Language:

english

File:

PDF, 114 KB

english, 1996

7

Atom probe microanalysis: Principles and appilcations to materials problems, by M.K. Miller and G.D.W. Smith. Materials Research Society, Pittsburgh, 1989, 278 pp, $47.00 (US), $56.00 (foreign)

Journal:

Microscopy Research and Technique

Year:

1992

Language:

english

File:

PDF, 55 KB

english, 1992

8

Handbook of crystallography for electron microscopists and other, by A. G. Jackson. Springer-Verlag, New York, 1991, 226 pp, $49.50

Journal:

Microscopy Research and Technique

Year:

1992

Language:

english

File:

PDF, 105 KB

english, 1992

9

Microscopy, edited by B.W. Rossiter and J.F. Hamilton. John Wiley and Sons, Inc., New York, 1991, 542 pp, $140.00 (USA)

Journal:

Microscopy Research and Technique

Year:

1992

Language:

english

File:

PDF, 130 KB

english, 1992

10

Images of materials, edited by D.B. Williams, A.R. Pelton, and R. Gronsky, 1991. Oxford University Press, New York, $75.00

Journal:

Microscopy Research and Technique

Year:

1993

Language:

english

File:

PDF, 85 KB

english, 1993

11

Electron microscopy I, edited by K.H. Kuo and Z.H. Zhai, World Scientific, Singapore, 1992, 660 pp, $78.00 (USA)

Journal:

Microscopy Research and Technique

Year:

1993

Language:

english

File:

PDF, 60 KB

english, 1993

12

Introduction to crystallography (revised edition), by C. Hammond. Royal Microscopical Society, Microscopy Handbooks 19, Oxford University Press, Oxford, UK, 1992, 132 pp, $19.95

Alwyn Eades, Ajay Singhal

Journal:

Microscopy Research and Technique

Year:

1993

Language:

english

File:

PDF, 67 KB

english, 1993

13

Magnification, by B. B. Norden and L. Ruschak. Lodestar Books (a division of Penguin Books), New York, 1993, 12 pp.

Journal:

Microscopy Research and Technique

Year:

1995

Language:

english

File:

PDF, 115 KB

english, 1995

14

Scanning force microscopy with applications to electric, magnetic, and atomic forces, by Dror Sarid. Oxford University Press, New York, 1994, 263 pp, $49.95

Journal:

Microscopy Research and Technique

Year:

1995

Language:

english

File:

PDF, 116 KB

english, 1995

15

Convergent-beam electron diffraction III, by M. Tanaka, M. Terauchi, and K. Tsuda. JEOL, Tokyo, Japan, 1994, 308 pp, $160.00

Journal:

Microscopy Research and Technique

Year:

1995

Language:

english

File:

PDF, 115 KB

english, 1995

16

EBSD geometry in the SEM: simulation and representation

Andrew Deal, Xiaodong Tao, Alwyn Eades

Journal:

Surface and Interface Analysis

Year:

2005

Language:

english

File:

PDF, 393 KB

english, 2005

17

Obtaining TEM images with a uniform deviation parameter

Journal:

Ultramicroscopy

Year:

2006

Language:

english

File:

PDF, 551 KB

english, 2006

18

Energy-filtered electron backscatter diffraction

Andrew Deal, Tejpal Hooghan, Alwyn Eades

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 854 KB

english, 2008

19

Energy-filtered electron backscatter diffraction: A correction

Andrew Deal, Tejpal Hooghan, Alwyn Eades

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 75 KB

english, 2008

20

Responsibility for nuclear weapons

BERRY, MICHAEL, EADES, ALWYN, FIELD, DAVID, POSTON, TIMOTHY, REECE, GORDON, ZIMAN, JOHN, CHARAP, JOHN

Journal:

Year:

1980

File:

PDF, 141 KB

1980

21

Microdiffraction in the transmission Electron Microscope

Journal:

JOM Journal of the Minerals, Metals and Materials Society

Year:

1985

Language:

english

File:

PDF, 1.21 MB

english, 1985

22

The Center for Microanalysis of Materials

Journal:

JOM Journal of the Minerals, Metals and Materials Society

Year:

1986

Language:

english

File:

PDF, 288 KB

english, 1986

23

Measurement and Mapping of Small Changes of Crystal Orientation by Electron Backscattering Diffraction

Tao, Xiaodong, Eades, Alwyn

Journal:

Microscopy and Microanalysis

Year:

2005

Language:

english

File:

PDF, 677 KB

english, 2005

24

Errors, Artifacts, and Improvements in EBSD Processing and Mapping

Tao, Xiaodong, Eades, Alwyn

Journal:

Microscopy and Microanalysis

Year:

2005

Language:

english

File:

PDF, 1.06 MB

english, 2005

25

Microscopy Society of America

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 107 KB

english, 2003

26

Monte Carlo Simulation for Electron Backscattering Diffraction

Tao, Xiaodong, Eades, Alwyn

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 161 KB

english, 2004

27

An Energy Filter for Electron Backscattering Diffraction

Hooghan, T K, Staib, Philippe, Eades, Alwyn

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 351 KB

english, 2004

28

Electron Crystallography: Electron Microscopy and Electron Diffraction, X. Zou, S. Hovmöller, and P Oleynikov. Oxford University Press (IUCr Texts on Crystallography 16), 2011, 335 pages. ISBN 978-0-19-958020-0 (Hardcover)

Journal:

Microscopy and Microanalysis

Year:

2012

Language:

english

File:

PDF, 40 KB

english, 2012

29

Contest

Journal:

Microscopy Today

Year:

2010

Language:

english

File:

PDF, 669 KB

english, 2010

30

An Order of Magnitude Improvement in STEM Resolution: Wavelength High-Energy Electron Localization

Morris, Walter Gordon, Madras, Squatter, Eades, Alwyn

Journal:

Microscopy Today

Year:

2010

Language:

english

File:

PDF, 1.36 MB

english, 2010

31

WHEEL: A Competition Report

Journal:

Microscopy Today

Year:

2010

Language:

english

File:

PDF, 1.79 MB

english, 2010

32

One of my Failures: Diffraction in the TEM

Journal:

Microscopy Today

Year:

2011

Language:

english

File:

PDF, 1.64 MB

english, 2011

33

Opinion

Journal:

Microscopy Today

Year:

2009

Language:

english

File:

PDF, 1.51 MB

english, 2009

34

International Programs in MSA

Journal:

Microscopy Today

Year:

2014

Language:

english

File:

PDF, 805 KB

english, 2014

35

A Challenge to Microscopists

Journal:

Microscopy Today

Year:

2015

Language:

english

File:

PDF, 830 KB

english, 2015

36

A significant bias

Journal:

Year:

2013

Language:

english

File:

PDF, 764 KB

english, 2013

37

The Refereeing Process

Journal:

Year:

1986

Language:

english

File:

PDF, 387 KB

english, 1986

38

Remember the Third World Reader

Hagstrom, Stig, Eades, Alwyn, Zypman, Fredy R.

Journal:

Year:

1989

Language:

english

File:

PDF, 609 KB

english, 1989

39

Is There Madness in the Scientist's Method?

Sparberg, Esther B., Eades, Alwyn, Colijn, Brenda B., Simmonds, Norm

Journal:

Year:

1988

Language:

english

File:

PDF, 1.16 MB

english, 1988

40

Does Pressure Pique Productivity?

Journal:

Year:

1988

Language:

english

File:

PDF, 1.02 MB

english, 1988

41

Complexions: A Revolutionary Taxonomy for Grain Boundaries

Journal:

Microscopy Today

Year:

2009

Language:

english

File:

PDF, 611 KB

english, 2009

42

Microscopy in Ecuador

Journal:

Microscopy Today

Year:

2006

Language:

english

File:

PDF, 668 KB

english, 2006

43

Choosing an Electron Backscattering System

Journal:

Microscopy Today

Year:

2000

Language:

english

File:

PDF, 8.60 MB

english, 2000

44

Some Things You Might Like to Know About Electron Lenses

Journal:

Microscopy Today

Year:

2000

Language:

english

File:

PDF, 5.66 MB

english, 2000

45

Insights on Diffraction

Journal:

Microscopy Today

Year:

2002

Language:

english

File:

PDF, 3.84 MB

english, 2002

46

Some Reflections on How Much Information is there on a Piece of Film, on How Film Compares with CCD Cameras and what Features a Scanner would need to Digitize TEM Negatives

Journal:

Microscopy Today

Year:

1996

Language:

english

File:

PDF, 8.15 MB

english, 1996

47

Some Reflections On How Much Information la There On A Piece Of Film, On How Film Compares With CCD Cameras And What Features A Scanner Would Meed To Digitize TEM Negatives

Journal:

Microscopy Today

Year:

1998

Language:

english

File:

PDF, 7.84 MB

english, 1998

48

A Call to Action

Journal:

Microscopy Today

Year:

2017

Language:

english

File:

PDF, 2.81 MB

english, 2017

49

Microscopy in Costa Rica

Journal:

Microscopy Today

Year:

2005

Language:

english

File:

PDF, 2.14 MB

english, 2005

50

Another Way to Implement Diffraction Contrast in SEM

Tao, Xiaodong, Eades, Alwyn

Journal:

Microscopy Today

Year:

2003

Language:

english

File:

PDF, 2.61 MB

english, 2003